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Jeol PH01135-1STIG/AFC for SEM Analysis

The Jeol PH01135-1STIG/AFC is an advanced component designed for use on Scanning Electron Microscopes (SEM). It integrates Secondary Electron Detection (SE) and Backscattered Electron Detection (BSE) capabilities, providing high-resolution imaging and material analysis for industrial and scientific research.

Manufacturer:Jeol

Model Number:PH01135-1

Module Classification:STIG/AFC

Precision Level:+/- 0.01 micron

Operating Voltage:220V – 240V

Frequency Range:50Hz – 60Hz

Power Consumption:200W

Weight:3.5kg

Dimensions:20cm x 30cm x 10cm

    This high-performance electron optics module is tailored for use with Scanning Electron Microscopes (SEM).

     Its advanced Stigmator/AFC technology ensures precise alignment and automatic focus correction, delivering unparalleled image clarity and resolution.

     Designed with durability and ease-of-use in mind, this module integrates seamlessly with JEOL’s comprehensive suite of SEM systems.

     Crafted from premium materials, it withstands the rigorous demands of continuous use in research environments.

     Detailed instructions are provided for optimal setup and operation, making it accessible for both beginners and experienced users alike.

Jeol PH01135-1

Jeol PH01135-1

Jeol PH01135-1




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